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Beilstein J. Nanotechnol. 2013, 4, 249–254, doi:10.3762/bjnano.4.26
Figure 1: Schematic description of the POA treatment. (a) A SiO2 hard mask is used to protect selectively the...
Figure 2: SCM profiling across the SiO2/4H-SiC interfaces on the faceted (blue squares) and flat (red circles...
Figure 3: (a) AFM single scan line taken on the surfaces of the faceted and flat samples. (b) Schematic cross...
Beilstein J. Nanotechnol. 2013, 4, 234–242, doi:10.3762/bjnano.4.24
Figure 1: As-grown graphene on a copper foil: (a) Optical image, (b) Raman Spectroscopy, (c) AFM morphology a...
Figure 2: Optical image of a (13 × 10) mm2 graphene membrane transferred onto SiO2 (a), and AFM morphologies ...
Figure 3: Tapping-mode AFM images of the bare PEN surface (a) and of graphene transferred onto PEN (b).
Figure 4: (a) Optical Image of a TLM structure, (b) I–V characteristics measured between pairs of contacts at...
Figure 5: (a) Schematic representation of the back-gated TLM device. (b) Resistance versus distance between a...
Figure 6: TRCAFM of Graphene on SiO2: (a) morphology and (c) the related histogram, (b) current map and (d) t...